A. Dey, R. Z. Rafi, S. Hasan Parash, S. K. Arko and A. Chakrabarty, "Fake News Pattern Recognition using Linguistic Analysis," 2018 Joint 7th International Conference on Informatics, Electronics & Vision (ICIEV) and 2018 2nd International Conference on Imaging, Vision & Pattern Recognition (icIVPR), Kitakyushu, Japan, 2018, pp. 305-309,
Dey, A., & Suthaharan, S. (2023). LDEB--Label Digitization with Emotion Binarization and Machine Learning for Emotion Recognition in Conversational Dialogues. arXiv preprint arXiv:2306.02193.
Talk at UC San Francisco, Department of Testing, San Francisco, California
Tutorial at UC-Berkeley Institute for Testing Science, Berkeley CA, USA
Talk at London School of Testing, London, UK
Conference proceedings talk at Testing Institute of America 2014 Annual Conference, Los Angeles, CA